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Angstrom Advanced Atomic Force Microscopy measures the surface of materials using a pointed tip on the end of a cantilever. A silicon or silicon nitride arm with a radius of curvature on the order of nanometers flexes due to intermolecular forces with the sample. The deflection of the cantilever is measured three different ways. It can be measured by reading the reflection of a laser from the cantilevers surface, a capacitive method or by a piezoresistive cantilever. The surface height is inputted into a feedback loop, which adjusts the height of the cantilever to avoid damaging it.
Our instruments and plants have been delivered to many renowned organizations Angstrom Advanced Inc. offers a wide variety of atomic force microscopes (AFMs) to suit your research needs. Our instruments are specifically designed with versatility in mind and can be expanded to meet new research demands. Years of innovation and design have lead to the Angstrom Advanced Inc. AFMs leading the industry in high-precision, low noise, low drift and measurements, which deliver artifact-free images in minutes. Functionality, usability and precise results combined with large sample platforms which save time and hassle. Angstrom Advanced AFM scientists and technical support staff provide premier service world wide to assist in much needed research.Our instruments and plants have been delivered to many renowned organizations. |