Full range of AFM, SEM, LFM, SPM and combined microscopy systems by Angstrom Advanced
Angstrom Advanced AA2000 Atomic Force Microscope
Introduction:
Angstrom Advanced Model AA2000 Atomic Force Microscope combines atomic force microscopy and lateral force microscopy in one unit. It features real-time online 3D imaging for better observation and multi-analysis for granularity and roughness. |
Specifications:
|
Features: | ||
High Performance
|
Multi-Function
|
Easy Operation
|
Angstrom Advanced AA3000 Scanning Probe Microscope
Features: | ||
High Performance
|
Multi-Function
|
Easy Operation
|
Angstrom Advanced AA5000 Multi-function SPM Systems
Introduction:
AA5000 Scanning Probe Microscope is our most innovative model. AA5000 features a full coverage of SPM techniques - STM, AFM, LFM Conductive AFM, MFM, EFM, Environmental Control SPM and Nano-Processing. The AA5000 is designed to provide images of atomic scale up to 100 micrometer. With a Digital Signal Processor (DSP) TMS320C642 inside the system, the AA5000 can handle complicated multi-functional tasks efficiently. A real-time operating system of SPM/DNA is embedded in AA5000 SPM system. |
Specifications:
|
Features:
- Multi-function: AFM, LFM, STM, Conductive AFM, MFM and EFM;
- Multi-Mode: Contacting Mode, Tapping Mode, Phase Imaging and Lifting Mode;
- SPM can be in liquid;
- Real-time temperature and humidity detecting;
- Force Analysis: I-V Curve, I-Z Curve, Force Curve and Amplitude Curve;
- Nano-Processing and manipulating: Lithography Mode and Vector Scan Mode;
- Fast automatically tip-engaging
- Simply change of the tip holder to switch between STM and AFM;
- Full digital control, auto system status recognition;
- Adjustable lightening inside
- With a 32-bit Digital Signal Processor (DSP) from Texas Instruments, 4.8 billion times of calculation per second can be achieved;
- Controller and Computer connected through a 10M/100M Fast Ethernet;
- Large sample size: up to diameter 45mm, 30mm thick;
- Online Control Software and offline Image Processing Software for Windows;
- Trace-Retrace scan, Back-Forward scan;
- Online real-time 3D image;
- Automatically Brightness and Contrast refresh;
- Data can be loaded out for further analysis;
- Nano-Movie function: Continuous data collection, storage and replay;
- Multi-Analysis: Granularity and Roughness;
- Tip Estimation and Image Re-construction;
- Modularized design for convenience of maintenance and future upgrade;
- Second display monitor and optical microscope system attachable;
Angstrom Advanced OS-AA Opening Multifunction Scanning Probe Microscope
Introduction:
Angstrom Advanced OS-AA Multi-function SPM system is known for its multi-functionality and full openness. Angstrom Advanced OS-AA system is not just a platform for unconventional experiments but also for further developments. |
Specifications:
|
Angstrom Advanced AA8000 Multi-function SEM System
Introduction:
The AA8000-SEM by Angstrom Advanced is a true multi-purpose, multi-user instrument. It is our latest model. It excels in versatility and flexibility by combining high performance in all SEM modes & Particle counter with ease of operation in a multi-user material research environment. This instrument features a perfect balance between stable configuration and an excellent resolution. Angstrom-SEM clearly shows Angstrom’s state-of-art technology. Its rock-solid reliability and fully automated control functions provide customer with the maximum analytical capability. Angstrom-SEM pursues compact SEM design which is great for office environment. Angstrom-SEM provides high scan speed and pixel resolution and high performance control driver with new PCI board. A full set of automated image adjustment functions make it easy for new users to quickly acquire crisp, noise-free images. Even experienced users will benefit from the automated contrast, brightness and focus.
The AA8000-SEM by Angstrom Advanced is a true multi-purpose, multi-user instrument. It is our latest model. It excels in versatility and flexibility by combining high performance in all SEM modes & Particle counter with ease of operation in a multi-user material research environment. This instrument features a perfect balance between stable configuration and an excellent resolution. Angstrom-SEM clearly shows Angstrom’s state-of-art technology. Its rock-solid reliability and fully automated control functions provide customer with the maximum analytical capability. Angstrom-SEM pursues compact SEM design which is great for office environment. Angstrom-SEM provides high scan speed and pixel resolution and high performance control driver with new PCI board. A full set of automated image adjustment functions make it easy for new users to quickly acquire crisp, noise-free images. Even experienced users will benefit from the automated contrast, brightness and focus.
Specifications:
Z ELECTRON OPTIC SYSTEM |
|
||||||||||||||||||||||||||||
DISPLAY |
|
||||||||||||||||||||||||||||
IMAGE ANALYZER |
|
||||||||||||||||||||||||||||
STAGE SYSTEM |
|
||||||||||||||||||||||||||||
VACUUM SYSTEM |
|
||||||||||||||||||||||||||||
CONTROL SYSTEM |
|